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"We find that DRAM error behavior in the field differs in many key aspects from commonly held assumptions. For example, we observe DRAM error rates that are orders of magnitude higher than previously reported, with 25,000 to 70,000 errors per billion device hours per Mbit and more than 8% of DIMMs affected by errors per year. We provide strong evidence that memory errors are dominated by hard errors, rather than soft errors, which previous work suspects to be the dominant error mode. We find that temperature, known to strongly impact DIMM error rates in lab conditions, has a surprisingly small effect on error behavior in the field, when taking all other factors into account. Finally, unlike commonly feared, we don’t observe any indication that newer generations of DIMMs have worse error behavior."
DRAM Errors in the Wild: A Large-Scale Field Study at Google, by Bianca Schroeder, Eduardo Pinheiro, and Wolf-Dietrich Weber (via Trivium)
